testing program time
英 [ˈtestɪŋ ˈprəʊɡræm taɪm]
美 [ˈtestɪŋ ˈproʊɡræm taɪm]
【计】程序测试时间
双语例句
- The significant density and performance improvement of VLSI ( Very Large Scale Integration) devices has brought with it new and major problems in device design, manufacturing and testing, resulting in an exponential increase in both device design time and device test program development time.
VLSI（超大规模集成电路）器件在密度和性能方面的飞速发展，给器件的设计、制造和测试提出了新的挑战，导致器件的设计时阃和测试程序的开发时间成指数增长。